	SS-110	SS-120
Wavelength Range	340 to 820 nm	635 to 1100 nm
Wavelength Measurement Interval	1 nm	1 nm
Wavelength Resolution	3 nm (full width half maximum)	3 nm (full width half maximum)
Wavelength Accuracy	± 0.5 nm	± 0.5 nm
Wavelength Repeatability	± 0.2 nm	± 0.2 nm
Analog to Digital Resolution	14 bit	14 bit
Signal to Noise Ratio	1500:1 (at maximum signal)	1500:1 (at maximum signal)
Stray Light	≤ 0.25 % at 590 nm	≤ 0.25 % at 850 nm
Dark Noise	≤ 3 counts	≤ 3 counts
Integration Time Range	10 ms to 10 s	10 ms to 10 s
Measurement Sensitivity	Greater than 10 % of max sensitivity for wavelengths greater than 380 nm	Greater than 10 % of max sensitivity for wavelengths greater than 1030 nm
Measurement Repeatability	Less than 1 % (wavelengths greater than 400 nm)	Less than 1 % (wavelengths greater than 1020 nm)
Directional (Cosine) Response	± 5 % at 75° zenith angle	± 5 % at 75° zenith angle
Fields of View	180° (upward-facing); 25° or 150° (downward-facing)	180° (upward-facing); 25° or 150° (downward-facing)
Temperature Response	-0.1 ± 0.1 % per C	-0.1 ± 0.1 % per C
Irradiance Calibration Uncertainty	± 5 %	± 5 %
电流消耗	190 mA (USB)	190 mA (USB)
Power Requirement	1 Watt (USB)	1 Watt (USB)
Interface Cable	5 m PVC jacket with USB (for computer)	5 m PVC jacket with USB (for computer)
Software	Apogee Spectrovision (windows compatible, XP and later; Mac compatible 10.9 and later)	Apogee Spectrovision (windows compatible, XP and later; Mac compatible 10.9 and later)
Operating Environment	-20 to 70 C, 0 to 100 % relative humidity	-20 to 70 C, 0 to 100 % relative humidity
Thread Size (for mounting)	¼-20	¼-20
Dimensions	89.3 mm height, 50.8 mm width, 38.1 mm depth	89.3 mm height, 50.8 mm width, 38.1 mm depth
Mass	300 g	300 g

SS-110

SS-120

Wavelength Range

340 to 820 nm

635 to 1100 nm

Wavelength Measurement Interval

1 nm

Wavelength Resolution

3 nm (full width half maximum)

Wavelength Accuracy

± 0.5 nm

Wavelength Repeatability